The PCT-XAS-F/T01 is developed for in situ XANES/EXAFS characterization, enabling real-time monitoring of the electronic structure and local atomic structure of catalysts in a realistic plasma reaction environment. The system supports gas switching, temperature regulation and continuous plasma discharge, dynamically tracking valence changes of active centers, coordination restructuring, metal-support interactions and plasma-induced structural evolution. It is well suited to studies of single-atom catalysts, cluster catalysts, highly dispersed metal materials and other advanced catalytic systems, providing a key in situ characterization platform for revealing the origin of plasma-catalytic activity, structure-performance relationships and reaction mechanisms.

• Operando characterization: supports in situ XANES/EXAFS measurements under plasma reaction conditions.
• Dynamic structure tracking: real-time monitoring of valence states, coordination structures and metal-support interaction evolution.
• Multi-parameter control: coordinated regulation of plasma, atmosphere and temperature for complex reaction studies.